==============================================================================
   TELCORP MICROELECTRONICS   //   FAB 2   //   WAFER ACCEPTANCE TEST
   Tool: PROBE07 (TEL Precio XL)          Export: SPC Exporter 4.2.1
==============================================================================

Lot ID          : L26-0417B
Recipe          : WAT_28NM_STD_v11
Operator        : m.okonkwo
Start Time      : 03/04/2026 07:14:02
Chuck Temp      : 25.0 ± 0.3 ℃
Probe Card      : PC-4471 (rev C)
Wafers Probed   : 3 of 25
Notes           : re-probe after ESD event on slot 12, see alarm log
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SECTION 1 - SITE PARAMETRIC SUMMARY

WAFER	SLOT	SITE	DIE_XY	VT_LIN	IDSAT	IOFF	RS_POLY	TEMP	RESULT
			(x,y)	V	µA/µm	pA/µm	Ω/sq	℃	
00123	01	1	(-3,7)	0.4412	612.4	1.24E-09	318.7	25.1	PASS
00123	01	2	(0,0)	0.4390	615.1	9.87E-10	319.2	25.0	PASS
00123	01	3	(3,-7)	0.4455	608.0	1.51E-09	317.9	25.2	P
00123	01	4	(-7,3)	0.4401	610.9	<0.001	318.1	25.1	PASS
00123	01	5	(7,-3)					25.1	FAIL
00456	07	1	(-3,7)	0.4502	598.2	2.04E-09	322.4	24.9	PASS
00456	07	2	(0,0)	0.4488	601.7	1.88E-09	321.8	25.0	PASS
00456	07	3	(3,-7)	0.4519	594.3	(2.11E-08)	323.1	25.0	F
00456	07	4	(-7,3)	0.4497	599.8	1.95E-09	322.0	24.8	PASS
00789	12	1	(-3,7)	0.3980	701.2	4.42E-07	310.4	25.3	FAIL
00789	12	2	(0,0)	0.3944	708.9	5.10E-07	309.8	25.4	FAIL
00789	12	3	(3,-7)	0.4011	697.4	3.98E-07	311.2	25.3	—
00789	12	4	(-7,3)	ABORT

--- ALARM LOG (excerpt) ---
2026-03-04 07:41:18 WARN  unit=PROBE07 slot=12 code=E-4471 msg="contact resistance drift" ohms=418.2
2026-03-04 07:41:52 ERROR unit=PROBE07 slot=12 code=E-2210 msg="probe card overtravel" z_um=142
2026-03-04 07:44:06 INFO  unit=PROBE07 slot=12 code=I-0001 msg="operator ack, re-probe queued"

SECTION 2 - LOT SUMMARY BY PARAMETER (spec limits applied)

PARAMETER        UNITS        LSL      TARGET       USL       MEAN      SIGMA   CPK  STATUS
VT_LIN           V         0.4200      0.4450    0.4700     0.43417   0.02011  0.87  MARGINAL
IDSAT            uA/um     580.00      610.00    640.00     628.9917  46.7712  0.08  FAIL
IOFF             pA/um          0        1.50     10.00       0.0000   0.0000  9.99  PASS
RS_POLY          ohm/sq    300.000     318.000   335.000    317.8333   4.6021  1.28  PASS
TEMP             degC       24.500      25.000    25.500     25.1000   0.1758  0.95  PASS

SECTION 3 - DISPOSITION

wafer_id,disposition,reason,dispo_date,engineer,rework_cost
00123,ACCEPT,within spec,2026-03-04,m.okonkwo,$0.00
00456,ACCEPT,"minor drift, monitored",03/05/2026,r.iyer,$0.00
00789,SCRAP,"ESD damage, slot 12, unrecoverable",5-Mar-26,r.iyer,"$14,220.00"
00790,HOLD,awaiting FA,20260306,,

SUMMARY
Total Sites Tested : 16
Sites Passed       : 9
Sites Failed       : 6
Yield              : 56.25%
Report Generated   : 2026-03-06T09:12:44Z
Signature          : /s/ r.iyer

*** END OF REPORT ***